Abstract: A microscope system and method allow for a desired x?-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x?-direction. The angle of offset of the x?-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x?-direction without a substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.

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Abstract: A process is provided for imaging a surface of a specimen with an imaging system that employs a BD objective having a darkfield channel and a bright field channel, the BD objective having a circumference. The specimen is obliquely illuminated through the darkfield channel with a first arced illuminating light that obliquely illuminates the specimen through a first arc of the circumference. The first arced illuminating light reflecting off of the surface of the specimen is recorded as a first image of the specimen from the first arced illuminating light reflecting off the surface of the specimen, and a processor generates a 3D topography of the specimen by processing the first image through a topographical imaging technique. Imaging apparatus is also provided as are further process steps for other embodiments.substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.

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Abstract: An XY translation stage includes a primary drive mechanism and a stage drive assembly. The primary drive mechanism rotates the stage drive assembly about an axis of rotation. The XY translation stage also includes an object stage that orbits freely in a defined plane without rotation of the object stage out of that defined plane. A stage pin associates the stage drive assembly with the object stage such that rotational movement of the stage drive assembly yields orbital movement of the object stage within the defined plane. The positioning of the stage pin relative to the axis of rotation is adjustable such that the diameter of the orbital movement of the object stage is adjustable.

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Abstract: An apparatus for manipulating an object includes first and second gesture controllers, each operatively connected to the object and structured and programmed such that, in a first-action active state, each can causes a first action to be carried out on the object by an appropriate first-action gesture made in the gesture controller. Only one of the first and second gesture controllers at any given time is capable of being in the first-action active state, and the first-action active state is transferable between the first and second gesture controllers upon the detecting of a first-action transfer gesture by one of said first gesture controller and said second gesture controller. Specific gesture control apparatus and methods for manipulating an object are also disclosed.

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Abstract: A microscope system and method empirically determines the boundaries of the depth of field of an objective lens. The system and method are largely automated, with the manipulation of a specimen to be imaged being carried out by processors and associated equipment. Calculations of the empirical depth of field are also likewise automated. Upon empirically determining the boundaries of the depth of field, the specimen, particularly when transparent or translucent, can be accurately imaged at user-defined depths smaller than the depth of field.

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Abstract: A microscope system and method empirically determines the boundaries of the depth of field of an objective lens. The system and method are largely automated, with the manipulation of a specimen to be imaged being carried out by processors and associated equipment. Calculations of the empirical depth of field are also likewise automated. Upon empirically determining the boundaries of the depth of field, the specimen, particularly when transparent or translucent, can be accurately imaged at user-defined depths smaller than the depth of field.

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Abstract: An XY translation stage includes a primary drive mechanism and a stage drive assembly. The primary drive mechanism rotates the stage drive assembly about an axis of rotation. The XY translation stage also includes an object stage that orbits freely in a defined plane without rotation of the object stage out of that defined plane. A stage pin associates the stage drive assembly with the object stage such that rotational movement of the stage drive assembly yields orbital movement of the object stage within the defined plane. The positioning of the stage pin relative to the axis of rotation is adjustable such that the diameter of the orbital movement of the object stage is adjustable.

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Abstract: An imaging apparatus includes a specimen placed on a known background of known bit depth values, and an image sensor having a field of view that includes at least a portion of the specimen and a portion of the known background. A sensor controller is included for recording an image of the portion of the specimen and the portion of the known background in the field of view, the apparatus further including means for effecting relative movement between the image sensor and the specimen.

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Abstract: A method for using an image sensor includes steps that permit the calculation of a resolution of the image that is greater than the designed resolution of the image sensor. A specimen is placed onto a known background within the field of view of an image sensor having multiple pixels. The specimen is focused onto the image sensor in a first position relative thereto such that the known background is also focused on the image sensor. An image is recorded for the specimen and the known background focused on the image sensor in the first position, and a specimen region and background pixels are established from the image recorded. The specimen is moved to a second position relative to the image sensor so as to place a portion of the specimen region within a target background pixel. An image is recorded for the specimen and the known background focused on the image sensor in the second position, and the bit depth is calculated for the portion of the specimen region moved into the background pixel.

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Abstract: A method for using an image sensor includes steps that permit the calculation of a resolution of the image that is greater than the designed resolution of the image sensor. A specimen is placed onto a known background within the field of view of an image sensor having multiple pixels. The specimen is focused onto the image sensor in a first position relative thereto such that the known background is also focused on the image sensor. An image is recorded for the specimen and the known background focused on the image sensor in the first position, and a specimen region and background pixels are established from the image recorded. The specimen is moved to a second position relative to the image sensor so as to place a portion of the specimen region within a target background pixel. An image is recorded for the specimen and the known background focused on the image sensor in the second position, and the bit depth is calculated for the portion of the specimen region moved into the background pixel.

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Abstract: A method for using an image sensor to obtain an image of a specimen focused thereon, such that the resolution of the image obtained is greater than the designed resolution of the image sensor includes focusing the specimen onto an image sensor having multiple pixels. Relative movement is carried out between the specimen and the image sensor to place the specimen at a plurality of discrete positions relative to the image sensor, and establishes sub-pixels and a plurality of equivalent sub-pixels, wherein equivalent sub-pixels are those sub-pixels that have the same portion of the specimen focused thereon at different discrete positions. Images of the specimen are digitally captured by means of the image sensor at each of the plurality of discrete positions, wherein a pixel value is recorded for each of the multiple pixels of the image sensor.

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Abstract: A process for testing the properties of a rubber sample is provided. This process is suitable for use with current rheometers, curemeters, viscometers, and the like, wherein it is common to change test conditions during the duration of the test, when the rubber sample scorches or reaches full cure. This process provides a method for determining an optimal time for changing the test conditions to which the rubber sample is subjected. With this process specifying times for changing test conditions is no longer required prior to starting the test. Rather, the variable test condition is changed at sample-specific times that closely coincide with the actual scorch time or full cure time of the sample.

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Abstract: A method for cutting compounded rubber for reflected light measurement of the disbursement of fillers therein is disclosed. The method includes subjecting a sample of compounded rubber to a dynamic pulling force, and cutting the sample while it is subjected to the dynamic pulling force. The method may further include the step of pressing the sample to remove entrapped air from the sample, and, preferably, the method includes cooling the sample during such a pressing step. Cutting the sample while it is subjected to a dynamic pulling force will reduce, and, preferably, eliminate, the presence of smears on a cut surface of the sample. By reducing the amount of entrapped air within a sample and, further, reducing the occurrence of smearing during cutting of the sample, a subsequent reflected light measurement of the dispersion of fillers within the compounded rubber sample is more accurate.

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Abstract: A method for cutting compounded rubber for reflected light measurement of the disbursement of fillers therein is disclosed. The method includes subjecting a sample of compounded rubber to a dynamic pulling force, and cutting the sample while it is subjected to the dynamic pulling force. The method may further include the step of pressing the sample to remove entrapped air from the sample, and, preferably, the method includes cooling the sample during such a pressing step. Cutting the sample while it is subjected to a dynamic pulling force will reduce, and, preferably, eliminate, the presence of smears on a cut surface of the sample. By reducing the amount of entrapped air within a sample and, further, reducing the occurrence of smearing during cutting of the sample, a subsequent reflected light measurement of the dispersion of fillers within the compounded rubber sample is more accurate.

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